The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Dec. 10, 2008
Tuan Quang Pham, New South Wales, AU;
Stephen James Hardy, New South Wales, AU;
Tuan Quang Pham, New South Wales, AU;
Stephen James Hardy, New South Wales, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Disclosed herein is a method of estimating a geometrical relationship between a first image () and a second image (), wherein the second image () includes a noise component. The method determines a location and size of each one of a plurality of image patches (), based on the noise component included in the second image () and correlation information derived from the first image (). The method then identifies a plurality of first image areas in the first image and a corresponding plurality of second image areas in the second image, based on the location and size of each one of the plurality of image patches. Each first image area of the first image () corresponds to a related second image area of the second image (). The method then determines a geometrical relationship between the first and second images () by comparing, for each one of the first image areas, information located within the first image area with information located within the corresponding related second image area.