The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Jul. 21, 2008
Frédéric Cassaing, Paris, FR;
Isabelle Mocoeur, Fresnes, FR;
Laurent Mugnier, Meudon, FR;
Abstract
The invention relates to a method of estimating at least one deformation of the wave front of an observation system or of an object observed by said observation system, characterized in that: at least one diversity image is acquired, in the vicinity of the focal plane of the observation system, in at least one diversity plane, the diversity image comprising a known diversity deformation; and in that in each diversity plane, an image model is determined based on at least one decomposition of the physical pupil of the system into a plurality of subpupils; a decomposition over each subpupil of the sought-after deformation in the form of at least one known deformation weighted by coefficients to be determined; a determination of the transfer function of the system by autocorrelation of its pupil; the linearization of each of the terms of the autocorrelation as a function of the coefficients of the sought-after deformation, the linearization being performed in the vicinity of the known diversity deformation; the object observed and noise; and in that on the basis of the image model(s) determined and of the image(s) acquired, the sought-after deformation(s) or the observed object is (are) estimated.