The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Oct. 02, 2007
Applicants:

Marcin Michal Kmiecik, Podchorazych, PL;

Wojciech Tomasz Nowak, Sucharskiego, PL;

Inventors:

Marcin Michal Kmiecik, Podchorazych, PL;

Wojciech Tomasz Nowak, Sucharskiego, PL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of producing linear features along a reference-line across a surface for use in a map database is disclosed. In at least one embodiment, the method includes generating, from reference-line data representative of coordinates of the reference-line in a geographic coordinate reference system and source images of the surface adjacent to the reference-line and associated position and orientation data in the geographic coordinate reference system, a reference-line referenced data set, wherein the reference-line referenced data set includes a plurality of sets of image data and associated data defining a reference-line' across a surface in the geographic coordinate reference system, the sets of image data including pixels wherein a set of image data corresponds to an orthorectified view representation of a line section of the surface in the geographic coordinate reference system, each set of image data includes a reference pixel being associated with a position on the reference-line, wherein each pixel represents a surface having a position at a distance from the position of the reference pixel along the line section, and wherein the line section perpendicularly crosses the reference-line at the position associated with the reference pixel; and, post processing the reference-line referenced data set to produce linear features along the reference-line and associated locations in the geographic coordinate reference system for use in a map database.


Find Patent Forward Citations

Loading…