The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Oct. 12, 2010
Applicants:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, San Jose, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Inventors:

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Akira Nakamura, San Jose, CA (US);

Takeshi Ohashi, Kanagawa, JP;

Jun Yokono, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for implementing a multi-step image recognition framework for classifying digital images are provided. The provided multi-step image recognition framework utilizes a gradual approach to model training and image classification tasks requiring multi-dimensional ground truths. A first step of the multi-step image recognition framework differentiates a first image region from a remainder image region. Each subsequent step operates on a remainder image region from the previous step. The provided multi-step image recognition framework permits model training and image classification tasks to be performed more accurately and in a less resource intensive fashion than conventional single-step image recognition frameworks.


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