The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Dec. 26, 2007
Applicants:

Yonathan Japha, Rehovot, IL;

Ron Folman, Rehovot, IL;

Yshai Avishai, Omer, IL;

Inventors:

Yonathan Japha, Rehovot, IL;

Ron Folman, Rehovot, IL;

Yshai Avishai, Omer, IL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an interferometer apparatus comprising a matter-wave guide enclosing an area, wherein a flux of particles may be guided in the matter-wave guide in at least two opposite paths, the matter-wave guide is rotatable relative to an inertial frame of reference; a first beam splitter to split the first beam to at least second and third beams, each of the second and third beams is to be guided in another path of the two opposite paths; and a second beam splitter allowing particles of the second and third beams to exit the matter-wave guide in a first probability and to stay in the matter-wave guide in a second probability.


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