The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Mar. 07, 2008
Applicants:

Tetsuya Kawanishi, Tokyo, JP;

Shinya Nakajima, Tokyo, JP;

Satoshi Shinada, Tokyo, JP;

Inventors:

Tetsuya Kawanishi, Tokyo, JP;

Shinya Nakajima, Tokyo, JP;

Satoshi Shinada, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Problem An object is to provide a method for evaluating characteristics of individual Mach-Zehnder (MZ) interferometers in an optical modulator which includes a plurality of MZ interferometers, Means for Solving Problems The method comprises a step for adjusting a bias voltage of the MZ interferometer, a step for eliminating zero-order components, a step for measuring an output intensity and a step for evaluating characteristics. An optical modulator () includes the first MZ interferometer () and the second MZ interferometer (). The first MZ interferometer () includes wave-branching section (). Two arms (), wave coupling section () and electrodes which is not shown in figures.


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