The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Mar. 20, 2008
Pavel Cheben, Ottawa, CA;
Siegfried Janz, Ottawa, CA;
Miroslaw Florjanczyk, Kanata, CA;
Dan-xia Xu, Ottawa, CA;
Pavel Cheben, Ottawa, CA;
Siegfried Janz, Ottawa, CA;
Miroslaw Florjanczyk, Kanata, CA;
Dan-Xia Xu, Ottawa, CA;
National Research Council of Canada, Ottawa, Ontario, CA;
Abstract
A spectrometer has a multi-input aperture for admitting an input wavefront and an array of multiple waveguide structures terminating at the multi-input aperture. The input wavefront is incident on each of the waveguide structures, which provide a dispersive function for the input wavefront. Interferometers are formed by elements of the waveguide structures. The interferometers have different optical path length differences (OPDs). The interferometers provide a wavelength responsive output for spatially extended light sources. The output of the interferometers is detected with a detector array. The spectrometer has an improved etendue, and in some embodiments very high resolution.