The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Feb. 26, 2009
Applicants:

Hitoshi Ootani, Itabashi-ku, JP;

Tadayuki Ito, Itabashi-ku, JP;

Inventors:

Hitoshi Ootani, Itabashi-ku, JP;

Tadayuki Ito, Itabashi-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A target set in a to-be-measured object and used for acquiring a reference value of point-cloud data, the target includes a small circle surrounded by a frame and having the center of the target, a large circle surrounded by the frame and disposed concentrically with the small circle so as to surround the small circle, a low-luminance reflective region located between the frame and the large circle and having the lowest reflectivity, a high-luminance reflective region located between the large circle and the small circle and having the highest reflectivity, and an intermediate-luminance reflective region located inside the small circle and having an intermediate reflectivity which is higher than the reflectivity of the low-luminance reflective region and which is lower than the reflectivity of the high-luminance reflective region.


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