The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Oct. 14, 2009
Applicants:

Yasushi Fujimoto, Hino, JP;

Yoshihiro Kawano, Bethlehem, PA (US);

Inventors:

Yasushi Fujimoto, Hino, JP;

Yoshihiro Kawano, Bethlehem, PA (US);

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/335 (2011.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope for virtual-slide creating system has a stage for holding the specimen, a transmitted-light illumination optical system for illuminating the specimen with transmitted light, an objective, a tube lens and an image capture unit. The objective is configured as a dry system of infinity-corrected type with an object-side numerical aperture of 0.8 or greater and a focal length for d-line rays in a range from 8 to 20 mm. The tube lens has a focal length in a range from 160 to 280 mm. The image capture surface of the image capture unit has a long side of 12 mm or longer and a pixel size (μm) satisfying the following condition:(μm)≦(0.61×0.59 (μ/m))/where a is the pixel size, and NA' is an image-side numerical aperture.


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