The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Jan. 19, 2012
Applicants:

Erik Lee Dinh, Boca Raton, FL (US);

Adam S. Bergman, Boca Raton, FL (US);

Manuel A. Soto, Lake Worth, FL (US);

Inventors:

Erik Lee Dinh, Boca Raton, FL (US);

Adam S. Bergman, Boca Raton, FL (US);

Manuel A. Soto, Lake Worth, FL (US);

Assignee:

Sensormatic Electronics, LLC, Boca Raton, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A metal detection device, system and method are provided. The device includes a receiver that receives a signal pattern representing electromagnetic field disturbances over time caused by movement of metal doors in a detection region. The device further includes a memory in communication with the receiver. The memory stores a recorded signal pattern of a previously received signal pattern and at least one quality criterion. The device further includes a processor in communication with the memory. The processor determines pattern vitals indicating a quality of the received signal pattern. The processor further determines whether the at least one quality criterion is met based at least in part on the pattern vitals. The processor further updates the recorded signal pattern based at least in part on determining whether the at least one quality criterion is met.


Find Patent Forward Citations

Dinh, Erik. (2013). Method and system for adaptive sliding door pattern cancellation in metal detection (U.S. Patent No. 8350699). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8350699

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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