The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

May. 25, 2010
Applicant:

Hiromi Nobukata, Kanagawa, JP;

Inventor:

Hiromi Nobukata, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/08 (2006.01); H04K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An embodiment of the invention provides a circuit for detecting a malfunction generation attack, including: at least one sensor circuit adapted to detect a radiation of a light; and a detection circuit for detecting an intermediate voltage between a voltage corresponding to a High level and a voltage corresponding to a Low level in accordance with an output from the at least one sensor circuit, and outputting a detection signal. At least one sensor circuit has an output node a level at which is changed in accordance with the radiation of the light, and outputs a signal corresponding to the level at the output node which is changed in accordance with the radiation of the light. The detection circuit outputs the detection signal when a level of the output signal from the at least one sensor circuit reaches a level previously set.


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