The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Mar. 12, 2010
Thomas R. Covey, Richmond Hills, CA;
Bradley B. Schneider, Bradford, CA;
John Vandermey, Georgetown, CA;
Thomas R. Covey, Richmond Hills, CA;
Bradley B. Schneider, Bradford, CA;
John Vandermey, Georgetown, CA;
DH Technologies Development Pte. Ltd., Singapore, SG;
Abstract
A sample analysis system incorporates an ion removal mechanism for removing residual ions from the sample analysis system. The ion removal mechanism can be included in an ion optics assembly, which connects an ion mobility filter to a mass analyzer. A sample to be analyzed by the sample analysis system may be entered into an ion mobility filter. The ion mobility filter filters the ions of the sample and passes the filtered group of ions to the ion optics assembly. The ion optics assembly transports the filtered group of ions to a mass analyzer where some or all of the ions in the group are detected. The ion removal mechanism then removes all or substantially all residual ions from the ion optics that were left over from the first filtered group before a second filtered group is passed through.