The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Jan. 12, 2012
Applicants:

Makio Okada, Kanagawa, JP;

Hidetoshi Kuraya, Kanagawa, JP;

Toshio Tanabe, Kanagawa, JP;

Yoshinori Fujisaki, Kumamoto, JP;

Kotaro Arita, Kumamoto, JP;

Inventors:

Makio Okada, Kanagawa, JP;

Hidetoshi Kuraya, Kanagawa, JP;

Toshio Tanabe, Kanagawa, JP;

Yoshinori Fujisaki, Kumamoto, JP;

Kotaro Arita, Kumamoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The yield of semiconductor devices is improved. In an upper die of a resin molding die including a pair of the upper die and a lower die, by lengthening the radius of the cross section of an inner peripheral surface of a second corner part facing an injection gate of a cavity more than that of the other corner part, a void contained in a resin in resin injection can be pushed out into an air vent without allowing the void to remain in the second corner part of the cavity. Consequently, the occurrence of the void in the cavity can be prevented and then the occurrence of the appearance defect of the semiconductor device can be prevented.


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