The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Oct. 12, 2010
Applicants:

Yukihiro Aoki, Okaya, JP;

Shinichi Shikata, Tsukuba, JP;

Hiroshi Uetsuka, Tsukuba, JP;

Chikashi Nakamura, Chofu, JP;

Nobuo Shimamoto, Mishima, JP;

Inventors:

Yukihiro Aoki, Okaya, JP;

Shinichi Shikata, Tsukuba, JP;

Hiroshi Uetsuka, Tsukuba, JP;

Chikashi Nakamura, Chofu, JP;

Nobuo Shimamoto, Mishima, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cantilever for measuring intra-cellular and inter-cellular microspaces of the present invention includes a support portion, a lever portion provided to the support portion so as to protrude therefrom, and a probe portion provided near a free end of the lever portion. The probe portion includes a conductive probe made of a carbon-based material, and an insulating film to coat a periphery of the conductive probe.


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