The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Jan. 15, 2008
Chan Gyun Shin, Suwon-si, KR;
Chan Gyun Shin, Suwon-si, KR;
Samsung SDI Co., Ltd., Yongin, Gyeonggi-do, KR;
Abstract
Disclosed is a multi-MEA test station capable of simultaneously testing and activating a plurality of MEAs and a multi-MEA test method using the same. The multi-MEA test station includes a chamber capable of receiving a plurality of MEAs; a first multi cell body including a first channel for supplying an oxidant to a cathode electrode of the MEA, and a second multi cell body including a second channel for supplying fuel to an anode electrode of the MEA; a pressing means closely adhering the first multi cell body, the second multi cell body and the MEA positioned therebetween by applying force in a direction that the first multi cell body and the second multi cell body are opposed to each other; a reactant supply means for supplying the oxidant to the first channel and supplying the fuel to the second channel; and a multi-loader controlling the environment of a test and activation on the plurality of MEAs and performing the test and the activation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile