The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Dec. 17, 2010
Applicants:

Viet Nguyen Hoang, Leuven, BE;

Pascal Bancken, Opwijk, BE;

Radu Surdeanu, Roosbeek, BE;

Benoit Bataillou, Lyons, BE;

David Van Steenwinckel, Holsbeek, BE;

Inventors:

Viet Nguyen Hoang, Leuven, BE;

Pascal Bancken, Opwijk, BE;

Radu Surdeanu, Roosbeek, BE;

Benoit Bataillou, Lyons, BE;

David van Steenwinckel, Holsbeek, BE;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a calibration circuit, computer program product, and method of calibrating a junction temperature measurement of a semiconductor element, wherein respective forward voltages at junctions of the semiconductor element and a reference temperature sensor are measured, and an absolute ambient temperature is determined by using the reference temperature sensor, and the junction temperature of the semiconductor element is predicted based on the absolute ambient temperature and the measured forward voltages.


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