The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Mar. 20, 2008
Applicants:

Hisashi Tsukada, Tokyo, JP;

Hiroyuki Aoki, Tokyo, JP;

Yasufumi Fukuma, Fort Lee, NJ (US);

Tsutomu Kikawa, Tokyo, JP;

Inventors:

Hisashi Tsukada, Tokyo, JP;

Hiroyuki Aoki, Tokyo, JP;

Yasufumi Fukuma, Fort Lee, NJ (US);

Tsutomu Kikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical image measurement device is configured to form a tomographic image at each of a plurality of cross sections of a measurement object, and the optical image measurement device comprises: an image processor configured to execute an arithmetic operation based on a tomographic image at one cross section of the plurality of cross sections and another tomographic image at each of one or more cross sections other than the one cross section, thereby forming a new tomographic image at the one cross section.


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