The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Sep. 28, 2006
Applicants:

Takeshi Muneishi, Higashiomi, JP;

Toshihiko Uemura, Higashiomi, JP;

Katsuya Okumura, Shinjuku-ku, JP;

Inventors:

Takeshi Muneishi, Higashiomi, JP;

Toshihiko Uemura, Higashiomi, JP;

Katsuya Okumura, Shinjuku-ku, JP;

Assignees:

Kyocera Corporation, Kyoto, JP;

Okutec Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Because a sample holderis composed of a plurality of convex partsprovided on a top face of a base substance, and the plurality of convex partsare spherical surfacesformed of a single crystal or amorphous material, frictional wear of the sample at contact parts between a sampleand the convex partsis reduced, thereby making it possible to inhibit particle generation. Further, because a joining layeris formed of a single crystal or amorphous material, there is no defect that particles scattered on the sample holderfill up it, which makes it possible to easily keep it in a clean state by cleaning, and it is possible to effectively reduce reattachment of particles to the sample


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