The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Aug. 16, 2007
Gregory Hovis, Martinez, GA (US);
William Ranson, Columbia, SC (US);
Reginald Vachon, Atlanta, GA (US);
Gregory Hovis, Martinez, GA (US);
William Ranson, Columbia, SC (US);
Reginald Vachon, Atlanta, GA (US);
Direct Measurements, Inc., Atlanta, GA (US);
Abstract
A binary code symbol for non-linear strain measurement that can be constructed in any geometric shape having a solid, continuous perimeter containing straight line segments. The symbol includes finder cells to 'orient' the symbol in order to associate strain measurements with physical dimensions; and contains encoded data in 'data regions' and/or “utility regions.” The data and utility regions can be distinct and separate, combined, exclusive (i.e. data regions and no utility regions, or utility regions and no data regions), or omitted. The data “density” can be varied depending upon the application, by varying the number of distinct data or utility cells present in the data regions or utility regions.