The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Apr. 25, 2007
Applicants:
Nobuhiko P. Kobayashi, Palo Alto, CA (US);
Shih-yuan Wang, Palo Alto, CA (US);
Alexandre M. Bratkovski, Palo Alto, CA (US);
R. Stanley Williams, Palo Alto, CA (US);
Inventors:
Nobuhiko P. Kobayashi, Palo Alto, CA (US);
Shih-Yuan Wang, Palo Alto, CA (US);
Alexandre M. Bratkovski, Palo Alto, CA (US);
R. Stanley Williams, Palo Alto, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/00 (2006.01); G01L 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sensing device includes a nanowire configured to deform upon exposure to a force, and a transducer for converting the deformation into a measurement. The nanowire has two opposed ends; and the transducer is operatively connected to one of the two opposed ends of the nanowire. The other of the two opposed ends of the nanowire is freestanding.