The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2013

Filed:

Dec. 16, 2010
Applicants:

Christoph Berndhaeuser, Nieder-Olm, DE;

Frank-thomas Lentes, Bingen, DE;

Karin Naumann, Ober-Olm, DE;

Hans Duerolf, Gau-Bischofsheim, DE;

Holger Hunnius, Mainz, DE;

Inventors:

Christoph Berndhaeuser, Nieder-Olm, DE;

Frank-Thomas Lentes, Bingen, DE;

Karin Naumann, Ober-Olm, DE;

Hans Duerolf, Gau-Bischofsheim, DE;

Holger Hunnius, Mainz, DE;

Assignee:

Schott AG, Mainz, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B 5/187 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a device for homogenizing a glass melt in a melt receptacle, wherein at least one stirring device is disposed in a melt receptacle, which comprises a stirrer shaft and a plurality of stirrer blades, and wherein a gap () is formed between a wall region of the melt receptacle and the stirrer blades. According to the invention, the respective stirring device causes an axial feed action in an inner stirring region between the stirrer shaft and the stirrer blades in order to feed the melt in the stirring region along the stirrer shaft. A melt flow brought about by the axial feed action seals the gap against direct passage of the melt. According to the invention, a very high gap width can be achieved, thus preventing the abrasion of materials in the region of the marginal gap. This also reduces the complexity required for adjusting the device. According to the invention, a high level of homogenization can be achieved regardless of the entry point of the inhomogeneities.


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