The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Sep. 30, 2008
Applicants:

Michael John Dutch, Saratoga, CA (US);

Christopher Hercules Claudatos, San Jose, CA (US);

William Dale Andruss, Minneapolis, MN (US);

Bruce David Leetch, Mason, OH (US);

Inventors:

Michael John Dutch, Saratoga, CA (US);

Christopher Hercules Claudatos, San Jose, CA (US);

William Dale Andruss, Minneapolis, MN (US);

Bruce David Leetch, Mason, OH (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data from application systems is copied to a server. The server generates different views of some or all of the data and provides the views to services that may be running on other systems. Each view may be of a subset of the data on the server, and the subsets may be mutually exclusive. Each view is in a format appropriate to the service consuming it, and the format may be block level, file level, stream, or other format appropriate to the service. The data may be deduplicated, and the deduplicated data processed by a service. The result of the processing of an object containing a deduplicated portion of data may be applied to other objects sharing the deduplicated portion of data. A workflow may be applied to the objects sharing the deduplicated portion of data.


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