The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Jul. 29, 2011
Applicants:

Pavan Y. Bashaboina, Hyderabad, IN;

James A. Culp, New Paltz, NY (US);

Inventors:

Pavan Y. Bashaboina, Hyderabad, IN;

James A. Culp, New Paltz, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Critical circuit blocks are identified in a chip design layout, and are marked by a marker layer identifying a marked region. Multiplicate layers are generated for each critical circuit block within each marked region. Each multiplicate layer includes a different type of variant for each identified critical circuit block. The different types of variants correspond to different types of optimization goals to address different issues in circuit performance. Circuit simulation is performed with each type of variants in combination with adjacent circuit blocks as provided in original design. In each marked region, the results of the circuit simulations are evaluated to determine an optimal type among the variants. The optimal type is retained in each marked region, thereby providing a chip design layout in which various marked regions can include different types of variant circuit blocks to provide local circuit optimization.


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