The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Sep. 21, 2010
Sumanta K. Bahali, Cary, NC (US);
Tu T. Dang, Cary, NC (US);
Michael C. Elles, Apex, NC (US);
Juan Q. Hernandez, Garner, NC (US);
Dwayne A. Lowe, Durham, NC (US);
Challis L. Purrington, Raleigh, NC (US);
Michael L. Scollard, Raleigh, NC (US);
Ivan R. Zapata, Cary, NC (US);
Sumanta K. Bahali, Cary, NC (US);
Tu T. Dang, Cary, NC (US);
Michael C. Elles, Apex, NC (US);
Juan Q. Hernandez, Garner, NC (US);
Dwayne A. Lowe, Durham, NC (US);
Challis L. Purrington, Raleigh, NC (US);
Michael L. Scollard, Raleigh, NC (US);
Ivan R. Zapata, Cary, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
One embodiment provides an error detection method wherein single-bit errors in a memory module are detected and identified as being a random error or a repeat error. Each identified random error and each identified repeat error occurring in a time interval is counted. An alert is generated in response to a number of identified random errors reaching a random-error threshold or a number of identified repeat errors reaching a repeat-error threshold during the predefined interval. The repeat-error threshold is set lower than the random-error threshold. A hashing process may be applied to the memory address of each detected error to map the location of the error in the memory system to a corresponding location in an electronic table.