The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Oct. 10, 2008
Shlomi Krepner, Sunnyvale, CA (US);
Yigal Shaul, Cupertino, CA (US);
Shlomi Krepner, Sunnyvale, CA (US);
Yigal Shaul, Cupertino, CA (US);
Teledyne LeCroy, Inc., Thousand Oaks, CA (US);
Abstract
A method and an apparatus for testing the physical layer of high speed serial communication devices and systems with protocol awareness is disclosed. The apparatus comprises of two major blocks: a General Purpose Platform (GPP) and an Analog Front End (AFE). Physical layer testing is divided into two sets of testing procedures: Receiver and Transmitter testing. This test system can be used in a traditional BERT setting where the test system commands the Device Under Test (DUT) to be placed into either a loop back mode, or into a more advanced mode where the test system is communicating with the DUT on a protocol level and counts the frame error ratio (FER). This FER is protocol dependent and each protocol receiver has its own way of reporting transmission errors to the transmitter. The protocol awareness of this invention is capable of detecting such a level of errors.