The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Mar. 17, 2006
David M. Chess, Mohegan Lake, NY (US);
Sophia Krasikov, Katonah, NY (US);
David W. Levine, New York, NY (US);
John F. Morar, Mahopac, NY (US);
Edward J. Pring, Yorktown Heights, NY (US);
Alla Segal, Mount Kisco, NY (US);
Ian N. Whalley, Pawling, NY (US);
David M. Chess, Mohegan Lake, NY (US);
Sophia Krasikov, Katonah, NY (US);
David W. Levine, New York, NY (US);
John F. Morar, Mahopac, NY (US);
Edward J. Pring, Yorktown Heights, NY (US);
Alla Segal, Mount Kisco, NY (US);
Ian N. Whalley, Pawling, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, computer program and method for inspection of a system under inspection. The system may include an inspection program configured to access information available at the system under inspection and generate inspection data for the system under inspection. A runtime platform independent from the inspection program at the system under inspection is configured to limit the limit the contents of the inspection data to a maximum information content. A trusted third-party computer system may assist in selecting the inspection program and transferring the resulting inspection data.