The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Sep. 06, 2007
Applicants:

Revathi Subramanian, San Diego, CA (US);

Vijay S. Desai, San Diego, CA (US);

Hongrui Gong, San Diego, CA (US);

Inventors:

Revathi Subramanian, San Diego, CA (US);

Vijay S. Desai, San Diego, CA (US);

Hongrui Gong, San Diego, CA (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Computer-implemented systems and methods for determining a subset of unknown targets to investigate. For example, a method can be configured to receive a target data set, wherein the target data set includes known targets and unknown targets. A supervised model such as a neural network model is generated using the known targets. The unknown targets are used with the neural network model to generate values for the unknown targets. Analysis with an unsupervised model is performed using the target data set in order to determine which of the unknown targets are outliers. A comparison of list of outlier unknown targets is performed with the values for the unknown targets that were generated by the neural network model. The subset of unknown targets to investigate is determined based upon the comparison.


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