The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Dec. 29, 2006
Christian A. Portal, Holliston, MA (US);
Michael J. Thomas, Framingham, MA (US);
Christian A. Portal, Holliston, MA (US);
Michael J. Thomas, Framingham, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
Generating cumulative metric data for a test in a test environment includes: generating in the test environment a test for a simulation model of a system under test; generating in the test environment at least one test condition for the test, the at least one test condition determining a plurality of iterations of the simulation model; generating in the test environment at least one temporary test variable for the test; generating in the test environment at least one mapping between a metric setting for the simulation model and one of the temporary test variables; running in the test environment the test for the plurality of iterations, wherein metric data for the simulation model is generated for each mapping and for each iteration of the test; and accumulating in the test environment the generated metric data for each mapping and for each iteration of the test to obtain cumulative metric data for the simulation model.