The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Aug. 10, 2010
David Brecht, San Diego, CA (US);
Patrick Bird, San Diego, CA (US);
David Brecht, San Diego, CA (US);
Patrick Bird, San Diego, CA (US);
Wildcat Disocovery Technologies, Inc, San Diego, CA (US);
Abstract
A system for assaying electronic or electrochemically active materials or devices made therefrom includes a microcontroller, a main digital-to-analog converter (DAC), current and voltage sensing modules, a reference voltage DAC, and a power switch. The reference voltage DAC applies a calibrated voltage across the materials/devices, and the switch disconnects the main DAC to generate an open-circuit voltage. The microcontroller assays the materials/devices using the measured voltage, measured current, reference voltage, and/or open-circuit voltage. The main DAC may include coarse and fine DACs. A method of assaying the materials/devices includes measuring an electrical current in and a voltage across the materials/devices using the respective current and voltage sensing modules, applying a reference voltage across the materials/devices using the reference voltage DAC, activating the switch to disconnect the DAC to generate the open-circuit voltage across the materials, and using the microcontroller to assay the materials/devices as noted above.