The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Jul. 24, 2009
Applicants:

Kai-yuan Ku, Taipei, TW;

Shih-chung Kang, Taipei, TW;

Shang-hsien Hsieh, Taipei, TW;

Jia-ruey Chang, Taipei, TW;

Peter Liu, Taipei, TW;

Inventors:

Kai-Yuan Ku, Taipei, TW;

Shih-Chung Kang, Taipei, TW;

Shang-Hsien Hsieh, Taipei, TW;

Jia-Ruey Chang, Taipei, TW;

Peter Liu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F16H 48/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A modular surface inspecting device is provided. A modular surface inspecting device comprises a computing layer having a processing unit in which a modular service-oriented software is installed; a detecting layer having a plurality of sensors obtaining a plurality of surrounding information; and a dynamic layer carrying the computing layer and the detecting layer and controlled by a controlling command generated by the computing layer according to the plurality of surrounding information.


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