The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Aug. 06, 2010
Su Wang, San Jose, CA (US);
Shengyang Dai, San Jose, CA (US);
Akira Nakamura, Cupertino, CA (US);
Takeshi Ohashi, Kanagawa, JP;
Jun Yokono, Tokyo, JP;
Su Wang, San Jose, CA (US);
Shengyang Dai, San Jose, CA (US);
Akira Nakamura, Cupertino, CA (US);
Takeshi Ohashi, Kanagawa, JP;
Jun Yokono, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Methods and systems disclosed herein provide the capability to automatically process digital pathology images quickly and accurately. According to one embodiment, an digital pathology image segmentation task may be divided into at least two parts. An image segmentation task may be carried out utilizing both bottom-up analysis to capture local definition of features and top-down analysis to use global information to eliminate false positives. In some embodiments, an image segmentation task is carried out using a 'pseudo-bootstrapping' iterative technique to produce superior segmentation results. In some embodiments, the superior segmentation results produced by the pseudo-bootstrapping method are used as input in a second segmentation task that uses a combination of bottom-up and top-down analysis.