The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Mar. 09, 2010
Fei Zhao, Schenectady, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Fei Zhao, Schenectady, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method of automatic defect recognition includes receiving a initial set of inspection image data of a scanned object from a scanning machine; applying a first image analysis algorithm to this set of inspection image data; then removing from the set of inspection image data any defect-free image regions, so as to retain a set of analyzed inspection image data; applying an additional image analysis algorithm(s) to the set of analyzed inspection image data, wherein the additional algorithm(s) has a higher computational cost than the first image analysis algorithm; and based on the applying of the additional image analysis algorithm(s), removing from the first set of inspection image data a second set of defect-free image regions, thereby retaining a set of twice-analyzed inspection image data.