The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Jul. 01, 2008
Hiroyuki Nose, Tokyo, JP;
Daisuke Ishida, Tokyo, JP;
Namio Kaneko, Tokyo, JP;
Yasuo Sakai, Tokyo, JP;
Mitsuru Uesaka, Tokyo, JP;
Fumito Sakamoto, Tokyo, JP;
Katsuhiro Dobashi, Tokyo, JP;
Hiroyuki Nose, Tokyo, JP;
Daisuke Ishida, Tokyo, JP;
Namio Kaneko, Tokyo, JP;
Yasuo Sakai, Tokyo, JP;
Mitsuru Uesaka, Tokyo, JP;
Fumito Sakamoto, Tokyo, JP;
Katsuhiro Dobashi, Tokyo, JP;
IHI Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Abstract
An X-ray waveform is generated by validating detection data corresponding to when an X-ray () is generated at a collision point () among X-ray detection data and invalidating other data. For example, when laser light () is pulse laser light and an electron beam () is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light () and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point ().