The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Mar. 10, 2009
Applicants:

Jon Kenneth Nisper, Grand Rapids, MI (US);

Thomas M. Richardson, Ada, MI (US);

Marc S. Ellens, Grand Rapids, MI (US);

Changbo Huang, San Francisco, CA (US);

Inventors:

Jon Kenneth Nisper, Grand Rapids, MI (US);

Thomas M. Richardson, Ada, MI (US);

Marc S. Ellens, Grand Rapids, MI (US);

Changbo Huang, San Francisco, CA (US);

Assignee:

X-Rite, Inc., Grand Rapids, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors. Furthermore, a method for using the calculated xDNA for rendering the surface color.


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