The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Mar. 26, 2009
Hideyuki Kurokawa, Ehime, JP;
Koji Miyoshi, Ehime, JP;
Masahiro Aga, Ehime, JP;
Kenji Murakami, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Hideyuki Kurokawa, Ehime, JP;
Koji Miyoshi, Ehime, JP;
Masahiro Aga, Ehime, JP;
Kenji Murakami, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Panasonic Corporation, Osaka, JP;
Abstract
Provided is a liquid sample analyzing method for analyzing an analyte in a liquid sample by using a test piece () on which overflow blocking lines () are formed to prevent the liquid sample from flowing to the outside from a passage region () of an extended layer (). In a state in which the liquid sample is not extended in the passage region () of the extended region (), the test piece () is measured so as to cross the passage region () of the extended layer () and the overflow blocking lines (). Thus in a state in which a difference in brightness is large between the passage region () of the extended region () and the overflow blocking lines (), it is possible to properly recognize the boundary portions between the passage region () of the extended region () and the overflow blocking lines ().