The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8345237 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2013

Filed:

Dec. 23, 2011
Applicants:

Ken Tsukii, Tokyo, JP;

Kenichi Kimura, Tokyo, JP;

Toru Takahashi, Tokyo, JP;

Jie Xu, Tokyo, JP;

Inventors:

Ken Tsukii, Tokyo, JP;

Kenichi Kimura, Tokyo, JP;

Toru Takahashi, Tokyo, JP;

Jie Xu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical information analyzing device includes an irradiating unit that irradiates irradiation light to specimens, a transmitted light receiving unit that receives transmitted light and detects the transmitted light as a transmitted light signal, a scattering/fluorescent light receiving unit that receives lateral scattering light and fluorescent light and detects the lateral scattering light and the fluorescent light as a scattering/fluorescent light signal, a nozzle position adjusting mechanism, and an analyzing unit that measures the optical information on the specimen on the basis of the detected transmitted light signal and the detected scattering/fluorescent light signal and analyzes the specimen.


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