The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8345104 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2013

Filed:

Feb. 06, 2010
Applicants:

Qing-hua Liu, Shenzhen, CN;

De-gang Liu, Shenzhen, CN;

Inventors:

Qing-Hua Liu, Shenzhen, CN;

De-Gang Liu, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing an image capturing function of an electronic device includes following blocks. A test program package with an exemplar image is installed in the electronic device. The electronic device is placed on a test fixture used for limiting an image capturing position and an image capturing angle of the electronic device. The electronic device captures an image to be tested by the electronic device. The image to be tested is compared with the exemplar image to determine whether the image capturing function of the electronic device is satisfactory.


Find Patent Forward Citations

Liu, Qing-Hua. (2013). System and method for testing image capturing function of an electronic device (U.S. Patent No. 8345104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8345104

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