The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Apr. 29, 2010
Applicants:

Michael Yih-hwa Jin, San Gabriel, CA (US);

Chi-yung Chang, Torrance, CA (US);

Inventors:

Michael Yih-Hwa Jin, San Gabriel, CA (US);

Chi-Yung Chang, Torrance, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/22 (2006.01); G01S 13/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

Range and Doppler ambiguities are common in radar, lidar, and acoustic systems. Resolving these ambiguities is important to achieve desirable geolocation and image quality performance in these systems. A new method is described to iteratively resolve the ambiguities. For Doppler ambiguity applications, a first PRF value and an initial Doppler frequency search window are selected. A new PRF is determined based on the ratio of the initial search window to the first PRF. The radar data of the first pair of PRF's is used to determine two modulo Doppler estimates. The modulo Doppler estimates are used to determine a new Doppler estimate with a confidence interval smaller than the first search window. The ratio of the new Doppler search window to the first PRF, is used to determine the next PRF. This process is iterated until the new Doppler search window is less than the first PRF.


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