The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
May. 06, 2010
Brian P. Hanley, Davis, CA (US);
Brian P. Hanley, Davis, CA (US);
Other;
Abstract
The present invention provides a method and device for the improvement of intraplexed assays. This improvement is based upon the use of multiple assay chemistries having different affinity constants (K) for an analyte. The overall assay displays high precision and predictable behavior because ratios between SMPCS-IDGs having different affinity constants (K) change based on concentration. The advantages of the Applicant's improved system relative to the system of the '290 patent are that the improved system (1) further increases the statistical significance of results from assays applied to single well samples, (2) improves compensation for multiple sources of error, (3) makes possible further increased precision for each analyte, and (4) improves correlation between instruments, even if the instruments have significantly varying responses to an identical stimulus, (4) makes possible improved determination of a margin of error.