The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Jul. 22, 2009
Applicants:

Yuka Ito, Ashigarakami-gun, JP;

Minquan Tian, Ashigarakami-gun, JP;

Suguru Nakaso, Ashigarakami-gun, JP;

Shinji Hasegawa, Ashigarakami-gun, JP;

Kazuhiko Hirokawa, Ashigarakami-gun, JP;

Miho Watanabe, Ashigarakami-gun, JP;

Takashi Matsubara, Ashigarakami-gun, JP;

Makoto Furuki, Ashigarakami-gun, JP;

Inventors:

Yuka Ito, Ashigarakami-gun, JP;

Minquan Tian, Ashigarakami-gun, JP;

Suguru Nakaso, Ashigarakami-gun, JP;

Shinji Hasegawa, Ashigarakami-gun, JP;

Kazuhiko Hirokawa, Ashigarakami-gun, JP;

Miho Watanabe, Ashigarakami-gun, JP;

Takashi Matsubara, Ashigarakami-gun, JP;

Makoto Furuki, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 9/09 (2006.01); C09D 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming material includes a perimidine-substituted squarylium dye that has a structure represented by the following formula (I) and shows diffraction peaks at least at Bragg angles (2θ±0.2°) of 17.7°, 19.9°, 22.1°, 23.2° and 24.9° in its X-ray powder diffraction spectrum measured by irradiation with X rays generated from a Cu target with a wavelength of 1.5405 angstroms:


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