The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8342034 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2013

Filed:

Dec. 04, 2009
Applicant:

Daniel J. Kane, Mercer Island, WA (US);

Inventor:

Daniel J. Kane, Mercer Island, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method to test a specimen is disclosed. In one embodiment, the apparatus comprises a housing defining a passage having a length extending along a longitudinal axis, an anvil movable in the passage between a first position and a second position along the longitudinal axis, the anvil comprising a tapered shaft section, an expandable mandrel having an inner surface adapted to fit around a portion of the tapered shaft section and an outer surface adapted to receive a test specimen, and a first block to limit motion of the mandrel. In use, moving the anvil between the first position and the second position causes the mandrel to expand in a circumferential direction, thereby applying a circumferential tension force to the specimen.


Find Patent Forward Citations

Kane, Daniel. (2013). System and method to test specimens (U.S. Patent No. 8342034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8342034

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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