The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Apr. 24, 2011
Applicants:

Hsiao-yun Su, Tu-Cheng, TW;

Ying-tso Lai, Tu-Cheng, TW;

Cheng-hsien Lee, Tu-Cheng, TW;

Inventors:

Hsiao-Yun Su, Tu-Cheng, TW;

Ying-Tso Lai, Tu-Cheng, TW;

Cheng-Hsien Lee, Tu-Cheng, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method of managing process factors that influence electrical properties of printed circuit boards (PCBs), n process factors are arranged in an order according to different influence to one kind of electrical property of the PCBs. The different influence is determined by first experiments designed using the Taguchi method. M process factors that have important influence to the electrical property are obtained from the n process factors according to the order to design second experiments. A computing formula for the electrical property is fitted using the m process factors according to simulated results of the second experiments, and a variation range of each of the m process factors is computed according to the computing formula.


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