The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Sep. 13, 2011
Subramanian Arumugam, Gainesville, FL (US);
Peter J. Haas, San Jose, CA (US);
Ravindranath Chowdary Jampani, Gainesville, FL (US);
Christopher Jermaine, Houston, TX (US);
Luis L Perez, Houston, TX (US);
Fei Xu, Bellevue, WA (US);
Subramanian Arumugam, Gainesville, FL (US);
Peter J. Haas, San Jose, CA (US);
Ravindranath Chowdary Jampani, Gainesville, FL (US);
Christopher Jermaine, Houston, TX (US);
Luis L Perez, Houston, TX (US);
Fei Xu, Bellevue, WA (US);
International Business Machines Corporation, Armonk, NY (US);
Rice University, Houston, TX (US);
University of Florida, Gainesville, FL (US);
Abstract
A risk analysis system and method are provided. The system includes an analyzer for analyzing database instances by executing a query on each database instance and selecting a cutoff value. The analyzer also discards the sets of uncertainty data that yield query-result values below the cutoff value and retains the database instances that yield query-result values above the cutoff value as elite sets. The system also includes a cloner to replicate the elite sets, and a sampler to modify the elite sets so that each elite set is mutually statistically independent while still yielding query-result values above the cutoff value.