The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Apr. 04, 2006
Applicants:

David Yaskin, Arlington, VA (US);

Greg Ritter, Washington, DC (US);

Inventors:

David Yaskin, Arlington, VA (US);

Greg Ritter, Washington, DC (US);

Assignee:

Blackboard Inc., Washington, DC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

A system of hardware and software provides a systematic and systemic method for performing assessment of the effectiveness of different levels within an institution. The system includes template driven definitions that span multiple tiers of hierarchically arranged operating units within the institution thereby providing flexibility and customization to handle a user-definable model of the institution's organization. In particular, one or more concurrently active assessment projects may be associated with an assessment initiative. In this way, portions of data collection and reporting may be shared within the program initiative and its various, associated assessment projects.


Find Patent Forward Citations

Yaskin, David. (2012). Method and system for an assessment initiative within a multi-level organization (U.S. Patent No. 8340992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8340992

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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