The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jan. 20, 2009
Kil Yoo Kim, Daejeon, KR;
Yoon Hwan Lee, Daejeon, KR;
Joon Eon Yang, Daejeon, KR;
Mee Jeong Hwang, Daejeon, KR;
Woo Sik Jung, Daejeon, KR;
Kil Yoo Kim, Daejeon, KR;
Yoon Hwan Lee, Daejeon, KR;
Joon Eon Yang, Daejeon, KR;
Mee Jeong Hwang, Daejeon, KR;
Woo Sik Jung, Daejeon, KR;
Korean Atomic Energy Research Institute, Daejon, KR;
Korea Hydro & Nuclear Power, Seoul, KR;
Abstract
Provided is a single quantification method of an external event PSA model containing multi-compartment scenarios, including: loading an internal event PSA logic model having core damage as a top event; constituting a mapping table comprising external events containing the multi-compartment scenarios in consideration of information regarding external event occurrence frequencies, external event-induced initiators, and equipments damaged by external events; reflecting the mapping table in the internal event PSA logic model to establish an external event PSA model; calculating a final minimum cut set (MCS) based on the external event PSA model; and calculating a core damage frequency (CDF) value according to the final MCS.