The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Apr. 20, 2010
Katsumi Homma, Kawasaki, JP;
Katsumi Homma, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A computer-readable recording medium stores therein a program causing a computer that accesses a simulator to execute receiving a measured yield distribution that expresses an actually measured yield distribution concerning leak current of a circuit-under-design, and model data for leak current of a cell of the circuit-under-design; providing the simulator with the model data and values for a normal distribution concerning variation components of the leak current of the cell; acquiring the leak current of the circuit-under-design; calculating, based on the acquired leak current, an estimated yield distribution concerning the leak current of the circuit-under-design; calculating values for the normal distribution that minimize error between the measured yield distribution and the estimated yield distribution; setting an initial value to the normal distribution and the calculated values for the normal distribution to the normal distribution; and outputting the estimated yield distribution that is based on the leak current of the circuit-under-design.