The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

Apr. 26, 2010
Applicants:

Marina Biberstein, Haifa, IL;

Andre Heilper, Haifa, IL;

Inventors:

Marina Biberstein, Haifa, IL;

Andre Heilper, Haifa, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Expert system may utilize multiple metrics to estimate whether a performance improvement activity has a potential to improve performance in respect to a predetermined performance metric. The multiple metrics may be propagated based on whether or not they may be affected by the activity and based on an associated value that may take into account the current value of the metric. An Index Propagation Graph may be further utilized to represent a propagation function which may propagate the potential of improvement of each metric in respect to the predetermined performance metric.


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