The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2012

Filed:

May. 11, 2010
Applicants:

Gary Walker Skinner, Rochester, NY (US);

Scott Seyfried, Rochester, NY (US);

Lalit Keshav Mestha, Fairport, NY (US);

Inventors:

Gary Walker Skinner, Rochester, NY (US);

Scott Seyfried, Rochester, NY (US);

Lalit Keshav Mestha, Fairport, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

What is disclosed is a novel system and method for characterizing a model-based spectral reflectance sensing device. In accordance with the teachings hereof, measurements of training samples taken with a previously manufactured 'fleet master' sensing device are adapted, in a manner more fully disclosed herein, based upon knowledge of the wavelengths of the illuminators used for both the subject and fleet master sensors, as well as spectral reflectance response of the training samples as measured by a reference spectrophotometer device. Utilizing the adapted measurements of the fleet master device, a reconstruction matrix can be quickly constructed for the subject sensor. The present system and method provides reasonably good accuracy using pre-existing measurement data. This results in manufacturing cost savings on a per-sensor basis.


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