The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Dec. 09, 2009
Jayanta Banerjee, Nashua, NH (US);
Seema Sundara, Nashua, NH (US);
Jayanta Banerjee, Nashua, NH (US);
Seema Sundara, Nashua, NH (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Systems, methods, and other embodiments associated with sequence matching with no more than a number E errors are disclosed. A test fragment to be located within a target sequence with at most a number E errors is received. The test fragment is broken into E+1 test sub-fragments. If one test sub-fragment is located within the target sequence with no errors; a determination is made as to whether the other test sub-fragments are located within the target sequence adjacent to the one test sub-fragment with a total of at most E errors. If the other test sub-fragments are located within the target sequence adjacent the one test sub-fragment with at most E errors, a location of the test fragment within the target sequence is returned.