The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jun. 16, 2008
Daniel J. Cox, Charlottesville, VA (US);
Boris P. Kovatchev, Amherst, VA (US);
Rayna S. Robeva, Amherst, VA (US);
Jennifer Kim Penberthy, Manakin Sabot, VA (US);
Daniel J. Cox, Charlottesville, VA (US);
Boris P. Kovatchev, Amherst, VA (US);
Rayna S. Robeva, Amherst, VA (US);
Jennifer Kim Penberthy, Manakin Sabot, VA (US);
University of Virginia Patent Foundation, Charlottesville, VA (US);
Abstract
A method, apparatus, and computer useable medium that provides, among other things, a standardized test protocol for screening and evaluation of attentional impairment using EEG data. Further, the method, apparatus, and computer program product enhances existing psychological, behavioral, and physiological EEG data acquisition systems by introducing a sequential stochastic model procedure, and an intelligent data interpretation component capable of assessing EEG inconsistencies associated attentional impairments. Potential users of this product will be any person or organization that diagnoses or treats persons with attentional or cognitive impairments. The method can be used for initial screening and diagnosis of disorders associated with impaired attention, such as ADHD, as well as for treatment and evaluation of the effects of treatments, such as medication or additional therapies.